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Custom 6T SRAM bit cell, taped out

A transistor-level memory design: cross-coupled NMOS inverters with grounded-gate PMOS pseudo-resistor loads, validated in SPICE, laid out in Magic VLSI on the Sky130 130 nm process, and taped out at 51.69 µm². Silicon is due back within months.

Magic VLSI layout of the PMOS-loaded SRAM bit cell
StatusTaped out
Process130 nm
Cell area51.69 µm²
Hold SNM265 mV
Build logic

What the project proves.

Architecture

The cell stores its bit on cross-coupled NMOS inverters, with two NMOS access transistors connecting the internal nodes to complementary bitlines under wordline control. The pull-ups are two PMOS devices with their gates tied to ground, acting as always-on pseudo-resistors: six transistors total, but a different tradeoff space than the classic CMOS 6T.

Why grounded-gate PMOS

Two pull-up approaches were compared: an explicit resistor load for early validation, and the grounded-gate PMOS pseudo-resistor. The resistor version consumed far too much layout area for a practical tile; the PMOS load delivered the pull-up behavior in a fraction of the footprint and made the compact final cell possible.

Validation

Write speed and hold static noise margin were validated in SPICE at 1.8 V, with butterfly-curve analysis giving a 265 mV hold SNM. The layout was drawn in Magic VLSI against the Sky130 process rules, then extracted so post-layout parasitics could be checked in ngspice before submission.

Tapeout and what comes back

The final 51.69 µm² cell went out for fabrication in December 2025. When silicon returns, the bring-up plan is direct: write through the bitlines, control the wordline, and observe read behavior and speed on an oscilloscope to compare reality against simulation.

Schematic

Six transistors, one bit.

How the cell holds a bit

Two cross-coupled NMOS inverters latch the bit between nodes Q and QB. The pull-ups are PMOS devices with their gates tied to ground: always on, behaving like compact pseudo-resistors that hold the high node up without the area cost of explicit resistors.

The wordline gates two NMOS access transistors connecting Q and QB to the complementary bitlines. Drive the bitlines to write; sense them to read. Stability came down to sizing: drivers strong enough to write reliably, loads weak enough to preserve the 265 mV hold margin.

Cell schematic

6T SRAM bit cell schematicCross-coupled NMOS inverters with grounded-gate PMOS pseudo-resistor loads store the bit on nodes Q and QB. Wordline-gated NMOS access transistors connect the nodes to complementary bitlines BL and BLB.VDDGNDBLBLBWLWLQQBgrounded-gate PMOS loads4 NMOS + 2 PMOS

Write through BL / BLB with WL high · pseudo-resistor loads hold the bit

Evidence

Highlights.

01

Compared explicit-resistor and grounded-gate PMOS pull-ups, choosing the PMOS pseudo-resistor for area.

02

Validated 1.8 V operation, write speed, and a 265 mV hold static noise margin using butterfly-curve analysis.

03

Completed layout, extraction, and post-layout checks with Magic VLSI and ngspice on the Sky130 process.

04

Taped out at 51.69 µm² in December 2025. Silicon due back for bench validation.

Next

Silicon is on the way.

The cell is out for fabrication. When the chip arrives, this page gains real measurements: read and write behavior, speed, and how post-silicon reality compares with simulation.